Categories Application Notes Applications Fundamental Research Octiv Mono 2.0 Octiv Poly 2.0 Octiv Suite 2.0 Process Performance Bias potential measurement with Octiv VI probe during atomic layer etching of SiO2 and Si3N4 with Low Global Warming C4H3F7O Isomers Post author By nadia lobo Post date November 1, 2023
Categories Application Notes Applications Octiv Mono 2.0 Octiv Poly 2.0 Octiv Suite 2.0 RF Match unit Characterization Utilizing Impedans Octiv VI Probes for Characterization of RF Matching Networks Post author By Sean Mulcahy Post date March 6, 2023
Categories Application Notes Langmuir Probe Model Validation Process Performance Semion 2500 V4 Impedans’ Semion and Langmuir Probe systems used to study the SiO2 sputter etch rate in RF-Biased ICP discharge Post author By Sean Mulcahy Post date December 2, 2022
Categories Application Notes Fundamental Research Langmuir Probe Tool Characterization Impedans Langmuir Probe used to analyse 13.56 MHz and 40 MHz capacitively coupled nitrogen plasmas Post author By Sean Mulcahy Post date December 2, 2022
Categories Application Notes Fundamental Research Langmuir Probe Langmuir probe used in a lunar dust application to measure the electron density and energy distribution Post author By Riyazul Mohamed Post date October 20, 2022
Categories Application Notes Process Performance Semion 2500 V4 Semion retarding field energy analyzer used to investigate reactive HiPIMS + MF sputtering of TiO2 crystalline thin films Post author By Riyazul Mohamed Post date October 20, 2022
Categories Application Notes Langmuir Probe Process Performance Semion 2500 V4 Semion 3KV Semion pDC Semion RFEA used for Ion energy distribution measurements in RF and pulsed DC plasma discharges Post author By Riyazul Mohamed Post date October 20, 2022
Categories Application Notes Process Performance Semion 2500 V4 Using Impedans Semion RFEA System to measure the effect of gas pressure on Ion Energy in a very-high frequency (VHF) magnetron sputtering discharge. Post author By Sean Mulcahy Post date October 20, 2022
Categories Application Notes Langmuir Probe Tool Characterization Investigation of the performances of the microwave plasma source ‘Aura-wave’ by Impedans Langmuir Probe System Post author By Sean Mulcahy Post date October 20, 2022
Categories Application Notes Semion 2500 V4 Tool Characterization In-Orbit Demonstration of Novel Thruster, characterized by Impedans Semion Retarding Field Energy Analyzer Post author By Sean Mulcahy Post date October 20, 2022
Categories Application Notes Octiv Suite 2.0 Process Performance Semion 2500 V4 Effect of substrate biasing on the ion properties of a magnetron sputtering system using Impedans’ Semion RFEA System and Octiv Suite 2.0 VI Probe Post author By Sean Mulcahy Post date October 20, 2022
Categories Application Notes Langmuir Probe Tool Characterization Application of Impedans Langmuir Probe for uniformity measurement in RF plasma source Post author By Sean Mulcahy Post date October 20, 2022
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