Plato Spatial Probe Features

Plato Probe Automated Electronics and Software Electronics Unit

Electronics UnitThe user-friendly electronics and software takes accurate and reliable measurements with a speed not seen on any other commercial Langmuir Probe. Using an intelligent pre-scan feature, the optimal plasma parameter measurements are performed easily and repeatedly.

Plato Probe Replaceable Tips

Probe tips are easily replaced with the “Easy-Fit” probe tip holder design. Probe tip material is tungsten as standard, with molybdenum, platinum and invar available. Custom probe lengths, diameters, materials, and shapes can be supplied on request and easily updated in the software analysis.

Time-Resolved Measurements

A high-speed mode is available to support high resolution time-resolved measurements with a time-step resolution of 10µs for pulsed and low frequency applications. Trigger frequencies 10Hz to 50kHz are supported, and a built-in programmable delay allows gating of the probe measurements.

Time Averaged Measurements

In applications where high speed resolution is not required averaging the measurement over a number of data points can be used to significantly reduce the noise.

External Trigger

The Plato Probe System is equipped with a TTL trigger of 10Hz to 50kHz.

RF Compensation

The Plato Probe includes RF chokes to provide RF compensation at the plasma driving frequency.